On the performance of VSI Shewhart control chart for monitoring the coefficient of variation in the presence of measurement errors

Nguyễn Hữu Du - Division of Artificial Intelligence, Dong A University, Danang, Vietnam

International Journal of Advanced Manufacturing Technology, SCIE, Q1

Abstract

In this paper, we propose a variable sampling interval Shewhart control chart to monitor the coefficient of variation (CV) squared, denoted by VSI SH-γ2. The new model overcomes the ARL-biased (average run length) property of the control chart monitoring the CV in a previous study by designing two one-sided charts rather than one two-sided chart. Moreover, the effect of measurement error on the performance of the VSI SH-γ2 control chart is investigated. The incorrect formula for the distribution of the CV in the presence of measurement error in a former study is fixed. Numerical simulations show that the precision errors and accuracy errors do have negative influences on the VSI SH-γ2 chart. An appropriate strategy based on the obtained results is suggested to reduce these negative effects.

DOI: https://link.springer.com/article/10.1007/s00170-019-03352-7